Shanghai Quantian Electromechanical Co., Ltd
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LP2 Modular Probe System
LP2 Modular Probe System
Product details
LP2 Modular Probe System

Used for workpiece inspection and alignment on various models of lathes, machining centers, and CNC grindersLP2.jpg

LP2 and LP2H

LP2 is standard configuration, while LP2H has higher spring force, allowing for the use of longer measuring needles and higher resistance to machine tool vibrations. There are two DD variants of the probe that use a dual sealing ring configuration, which are used in harsh working environments where coolant contains a large amount of debris

All variants are applicable to modular OMP40M and OMP60M optical transmission systems; RMP40M and RMP60M wireless transmission systems; And inductive transmission module. They can also be used for grinding machine inspection applications through hard wire connections.

Features and advantages

Mature motion mechanism design

Anti interference, hard wired communication

Micro design

Sealing performance

Enhance 1 μ m to 2 μ m 2 σ repeatability (depending on the probe)

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Successful operation!

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